Degree
Bachelor of Science (B.S.)
Major(s)
Physics
Document Type
Immediate Open Access
Abstract
The experiment will measure the thickness of a thin aluminum foil by sending a beam of x-rays through the foil. The thickness of the foil is related to the difference in the intensity of x-rays that pass through the aluminum window and the initial intensity of the x-ray source. The intensity is also related to a property of the material known as its attenuation coefficient. To calculate the attenuation coefficient, another foil with known thickness, mass, and surface density is used to calculate the attenuation coefficient.
DOI
https://doi.org/10.54718/YVCE2067
Date Defended
4-1-2016
Thesis Director
Dunne, James A.
Second Committee Member
Dutta, Dipangkar
Third Committee Member
Oppenheimer, Seth F.
Recommended Citation
Gaerlan, Oliver Mikhail H., "Measurement of material thickness using X-ray attenuation" (2016). Honors Theses. 26.
https://scholarsjunction.msstate.edu/honorstheses/26
