Measurement of material thickness using X-ray attenuation

Author

Oliver Mikhail H. Gaerlan

College

College of Arts and Sciences

Department

Department of Physics and Astronomy

Degree

Bachelor of Science (B.S.)

Major

Physics

Abstract

The experiment will measure the thickness of a thin aluminum foil by sending a beam of x-rays through the foil. The thickness of the foil is related to the difference in the intensity of x-rays that pass through the aluminum window and the initial intensity of the x-ray source. The intensity is also related to a property of the material known as its attenuation coefficient. To calculate the attenuation coefficient, another foil with known thickness, mass, and surface density is used to calculate the attenuation coefficient.

Date Defended

4-1-2016

Thesis Director

Dunne, James A.

Second Committee Member

Dutta, Dipangkar

Third Committee Member

Oppenheimer, Seth F.

Recommended Citation

Gaerlan, Oliver Mikhail H., "Measurement of material thickness using X-ray attenuation" (2016). Honors Theses. 26.
https://scholarsjunction.msstate.edu/honorstheses/26