Measurement of Material Thickness using X-Ray Attenuation

Author

Abdullah Riyad Altayar

Issuing Body

Mississippi State University

Advisor

Dutta, Dipangkar

Committee Member

Dunne, James A.

Committee Member

Winger, Jeffry A.

Date of Degree

8-11-2017

Document Type

Graduate Thesis - Open Access

Major

Physics

Degree Name

Master of Science

College

College of Arts and Sciences

Department

Department of Physics and Astronomy

Abstract

The 60 kev x-rays from Americium-241 (241Am) have been used in an x-ray attenuation experiment to measure the thickness and attenuation coefficient of an aluminum alloy. Using traditional measurement tools such as a micrometer, to determine the thickness and uniformity of soft metal targets and curved aluminum target cell windows is challenging. Furthermore, the determination of window thickness is important to Jefferson Lab experiments, in particular the Qweak experiment. In this thesis, the thickness of Aluminum foil AL7057 is determined with high accuracy using x-ray attenuation. Using the x-ray attenuation technique has the advantage of nondestructive measurement.

URI

https://hdl.handle.net/11668/20058

Comments

attenuation||x-rays||measurement||photon interactions||thesis

Recommended Citation

Altayar, Abdullah Riyad, "Measurement of Material Thickness using X-Ray Attenuation" (2017). Theses and Dissertations. 3028.
https://scholarsjunction.msstate.edu/td/3028